X-Ray Fluorescence (XRF) Measuring Systems for PCB Testing


Fischer Technology has enabled the measurement of ENi Phosphorus content through Au and Pd layers in ENIG and ENEPIG applications. The XDAL-SDD with the industry’s largest detector (50 mm) is the ideal instrument for adhering to IPC 4552 A & 4556. Fischer’s dedication to continually improving upon their technologies is evidence by their over 65 years in the XRF field.

The instrument is designed as user-friendly bench-top instrument. It is equipped with a high-precision, programmable XY-stage and an electrically driven Z-axis. A gap in the housing allows for measurements on large flat specimens, which do not fit in the measuring chamber, e.g. large printed circuit boards. The sample stage moves into the loading position automatically, when the protective hood is opened.


Measuring ENIG & ENEPIG Coatings?

Click below to download the white paper written by
Jim Bogert (Fischer’s Director of Western Sales)
on making ENIG & ENEPIG metrology easy.